Power Ballast and Dual LED Driver for Automotive Front Lighting

The NCV78663 is a single−chip and high efficient smart Power ballast and Dual LED DRIVER designed for automotive front lighting applications like high beam, low beam, daytime running light (DRL), turn indicator, fog light, static cornering, and so on. The NCV78663 is a best fit for high current LEDs and provides a

The NCV78663 is a best fit for high current LEDs and provides a complete solution to drive two strings up to 60 V, by means of two internal independent buck switch channels, with a minimum of external components. For each channel, the output current and voltage can be customized

For each channel, the output current and voltage can be customized according to the application requirements. Diagnostic feature for automotive front lighting is provided on−chip. The device integrates a voltage booster controller, realizing a unique

The device integrates a voltage booster controller, realizing a unique input current filter with a limited number of externals. The NCV78663 can be used in stand−alone mode or together with a

The NCV78663 can be used in stand−alone mode or together with a companion microcontroller allowing maximum flexibility. Depending on the voltage and current of the connected LED string, the LED ballast parameters can be adapted by writing the SPI settings in the device, as such that no hardware changes are required. Features

Features • Single Chip Boost−Buck Solution

• Single Chip Boost−Buck Solution • Two Independent LED Strings Up to 60 V

• Two Independent LED Strings Up to 60 V • High Overall Efficiency

• Minimum of External Components • Active Input Filter with Low Current Ripple from Battery

• High Overall Efficiency • Minimum of External Components

• Active Input Filter with Low Current Ripple from Battery • Integrated Switched Mode Buck Current Regulator

• Integrated Switched Mode Buck Current Regulator • Two Integrated Buck Switches with 1.4 A Peak Current Capability

• Two Integrated Buck Switches with 1.4 A Peak Current Capability • Integrated Boost Controller

• Programmable Input Current Limitation • Average Current Regulation Through the LEDs

• Integrated Boost Controller • Programmable Input Current Limitation

• Average Current Regulation Through the LEDs • High Operating Switching Frequencies to Reduce Inductor Sizes

• SPI Interface for Optional External C and Dynamic Control of System Parameters • This is a Pb−Free Device

• Low EMC Emission for LED Switching and Dimming • SPI Interface for Optional External C and Dynamic Control of

• High Operating Switching Frequencies to Reduce Inductor Sizes • Integrated PWM Dimming with Wide Frequency Range

• DRL • Position or Park light

• This is a Pb−Free Device

• Static Cornering

• Low Beam • DRL

Typical Applications • High Beam

MARKING DIAGRAM

\

http://onsemi.com

A = Assembly Location WL = Wafer Lot

A = Assembly Location WL = Wafer Lot YY = Year

WW = Work Week G = Pb−Free Package

G = Pb−Free Package

ORDERING INFORMATION See detailed ordering and shipping information in the package

See detailed ordering and shipping information in the package dimensions section on page 36 of this data sheet.


NCV78663

Figure 1. Internal Block Diagram


NCV78663

PACKAGE AND PIN DESCRIPTION

Figure 2. Pin Connections

Table 1. PIN DESCRIPTION

Pin# Pin Name IO Type Function
1 GNDP ground Power ground
2 VGATE MV out Booster MOSFET gate pre-driver
3 VDRIVE MV supply 10 V supply
4 VBB HV supply Battery supply
5 N.C. Not used (can be connected to GND)
6 LEDCTRL1 HV IO LED string 1 enable
7 LEDCTRL2 HV IO LED string 2 enable
8 DIAG1 LV out LED string 1 diagnostic output
9 DIAG2 LV out LED string 2 diagnostic output
10 VDD LV supply 3 V logic supply
11 GND Ground Ground
12 TEST1 LV in Test (not used in application, must connected to GND)
13 TEST2 LV in Test (not used in application, must connected to GND)
14 N.C. Not used (can be connected to GND)
15 SCLK MV in SPI clock
16 SCS(CSB) MV in SPI chip select(chip select bar)
17 SDI MV in SPI data input
18 SDO MV open-drain SPI data output
19 VTEMP/AGP2 LV in LED string 2 temperature feedback input
20 VTEMP/AGP1 LV in LED string 1 temperature feedback input
21 VLED2 HLV in LED string 2 forward voltage input
22 VLED1 HLV in LED string 1 forward voltage input
23 N.C. Not used (can be connected to GND)
24 IBCK2SENSE+ HLV in Buck 2 positive sense input
25 IBCK2SENSE- HLV in Buck 2 negative sense input

NCV78663

Table 1. PIN DESCRIPTION

Pin# Pin Name IO Type Function
29 VINBCK1 HV in Buck 1 high voltage supply
30 IBCK1SENSE- HV in Buck 1 negative sense input
31 IBCK1SENSE+ HV in Buck 1 positive sense input
32 N.C. Not used (can be connected to GND)
33 VBOOST HV supply High voltage feedback input
34 VBOOSTM3V HV IO VBOOST-3V output
35 IBSTSENSE- LV IO Battery current negative feedback input
36 IBSTSENSE+ LV IO Battery current positive feedback input
  1. RSDO external resistor typical value is 1 k. An additional capacitor to ground (typically 47 pF) may be used in case of application noise observed.

  2. External capacitors or RC may be added to these SPI lines for stable communication in case of application noise. The selection of these

  3. As reported in the application diagram, the device pins TEST1 and TEST2 must be connected to ground.

  4. For details about PCB layout, please refer to the dedicated section.

  5. For details about PCB layout, please refer to the dedicated section.

  6. RF1 and RF2 resistors typical value is 2.2 k and minimum required value is 1 k. It is recommended not to exceed a value of 22 k in order not to alter the VLED sampled value.


NCV78663

OPERATING CONDITIONS

Table 2. ABSOLUTE MAXIMUM RATINGS

Characteristic Symbol Min Max Unit
Battery Supply voltage(Note 6) VBB -0.3 60 V
LED supply voltage(Note 7) VBOOST -0.3 68 V
Logic Supply voltage VDD -0.3 3.6 V
Low voltage I/O pins(Note 8) IOLV -0.3 VDD+0.3 V
Gate driver supply voltage(Note 9) VDRIVE -0.3 12 V
GNDP voltage GNDP_V -0.3 0.3 V
Input current sense voltage IBSTSENSE+,IBSTSENSE- -1.0 3.6 V
Medium voltage IO pins(Note 10) IOMV -0.3 7.0 V
Buck switch low side LBCKSW1,LBCKSW2 -2.0 VBOOST V
Relative voltage IO pins(Note 11) ΔV_IO VBOOSTM3V VBOOST V
Storage Temperature Tstrg -50 135 ℃
Buck switch output current(Note 12) I_LBCKSW 1.4 A
Electrostatic discharge on component level(Note 13) VESD -2 +2 kV

^circ mathrm C,{}

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 6. Absolute maximum rating for pins: VBB, LEDCTRL1, LEDCTRL2.

  1. Absolute maximum rating for pins: VBB, LEDCTRL1, LEDCTRL2.

  2. Absolute maximum rating for pins: VBOOST, VBOOSTM3V, IBCK1SENSE+, IBCK1SENSE−, VINBCK1, VLED1, IBCK2SENSE+,

  3. Absolute maximum rating for pins: VBOOST, VBOOSTM3V, IBCK1SENSE+, IBCK1SENSE−, VINBCK1, VLED1, IBCK2SENSE+, IBCK2SENSE−, VINBCK2, VLED2.

  4. Absolute maximum rating for pins: TEST1, TEST2, VTEMP1, VTEMP2, DIAG1, DIAG2.

  5. Absolute maximum rating for pins: TEST1, TEST2, VTEMP1, VTEMP2, DIAG1, DIAG2.

  6. Absolute maximum rating for pins: VDRIVE, VGATE.

  7. Absolute maximum rating for pins: VDRIVE, VGATE. 10.Absolute maximum rating for pins: SCLK, SCS, SDI, SDO.

  8. Relative maximum rating for pins: VINBCK1, VINBCK2, IBCK1SENSE+, IBCK2SENSE+, IBCK1SENSE−, IBCK2SENSE− 12.Peak value. 13.Human Body Model (100 pF via 1.5 k, according to JEDEC EIA/JESD22−A114).

12.Peak value. 13.Human Body Model (100 pF via 1.5 k, according to JEDEC EIA/JESD22−A114).

  1. A mission profile describes the application specific conditions such as, but not limited to, the cumulative operating conditions over life time, the system power dissipation, the system’s environmental conditions, the thermal design of the customer’s system, the modes, in which the device is operated by the customer, etc. 15.VBB = 13 V; Idrive = 10 mA
Characteristic Symbol Min Max Unit
Battery Supply Voltage VBB 5 40 V
Battery Supply Current(Note 15) IBB 20 mA
Logic Supply Output Current IDD 10 mA
5V Tolerant IO pins DIGIO_V 0 5.5 V
VTEMP/AGPx pins VTEMPAGP_V 0.3 VDD V
Gate Driver Supply Current(Note 16) Idrive 10 mA
Ambient Temperature TA -40 125 ℃
Junction Temperature TJ -45 170 ℃
VBB Voltage during OTP Zapping VBB_ZAP 13 40 V
OTP zap Ambient Temperature TA_zap 10 30 ℃
Buck Switch Output Current(Note 17) I_LBCKSW 1.2 A

\mathsf{V}_{\mathsf B\mathsf{B},mathsfmathsf{Z A P}}

\ {\sf{T}}_{\sf{A}}

15.VBB = 13 V; Idrive = 10 mA 16.VBB = 13 V; Idrive = Q_gate x f_boost 17.Average value

17.Average value


NCV78663

Table 4. THERMAL RESISTANCE

Characteristic Package Symbol Max Unit
Thermal resistance junction to exposed pad SSOP36 $\theta_{JCbot}$ 3.49 KW-1

ELECTRICAL CHARACTERISTICS

NOTE: Unless differently specified, all device Min & Max parameters boundaries are given for the full supply operating range and the junction temperature (TJ) range (-40;160) (°C).

(left({\ \mathord\\ {\ \ \ \ \ }}\ \right)

Table 5. VBB: BATTERY SUPPLY INPUT

Characteristic Symbol Conditions Min Typ Max Unit
Nominal Operating Supply Range VBB 5 40 V
Device Current Consumption IBB_0 buck regulators off, gate drive off, outputs unloaded 6 10 mA

Table 6. VDRIVE: 10 V SUPPLY FOR BOOST FET GATE DRIVE CIRCUIT

Characteristic Symbol Conditions Min Typ Max Unit
VDRIVE regulator output voltage VDRIVE $V_{BB}>11\text{ V}:VDRIVE generated from VREG10V 9 10 11 V
$V_{BB}<10\text{ V}:VDRIVE generated from VBOOST_AUXSUP*$ MAX(5.5; $V_{BB}-1.65$) 7.8 V
DC output current capability lout_VDRIVE 15 mA
Output current limitation ILIM_VDRIVE $V_{BB}>11\text{ V}:VDRIVE generated from VREG10V$ 36 185 mA
$V_{BB}<10\text{ V}:VDRIVE generated from VBOOST_AUXSUP$ 15 190 mA
Typical VDRIVE external decoupling capacitor C_VDRIVE 0.47 $\mu F$
ESR 200 mΩ

*Boost regulator must be active.

Table 7. VDD: 3 V LOW VOLTAGE ANALOG DIGITAL SUPPLY

Characteristic Symbol Conditions Min Typ Max Unit
VDD regulator output voltage VDD VDRIVE>4.5V 2.9 3 3.1 V
DC output current capability lout_VDD VDRIVE>4.5V 10 mA
Output current limitation Illim_VDD VDRIVE>4.5V 40 200 mA
Typical VDD external decoupling capacitor C_VDD 0.22 0.47 10 μF
ESR 200 mΩ
POR Toggle level on VDD rising POR3V_H 1.43 2.3 2.54 V
POR Toggle level on VDD falling POR3V_L 1.26 2.0 2.14 V
POR Hysteresis POR3V_Hyst 0.25 V

NCV78663

Table 8. VBOOSTM3V: HIGH SIDE AUXILIARY SUPPLY

Characteristic Symbol Conditions Min Typ Max Unit
VBSTM3 regulator output voltage VBSTM3 Referenced to VBOOST -3.6 -3.3 -2.9 V
Output current limitation Ilim_VBOOSTM3V 200 mA
Typical VBSTM3 decoupling capacitor C_VBSTM3 Referenced to VBOOST 0.47 4.7 μF
ESR Referenced to VBOOST 200 mΩ

Table 9. OSC4M: SYSTEM OSCILLATOR CLOCK

Characteristic Symbol Conditions Min Typ Max Unit
System oscillator frequency FOSC4M After trimming 3.5 4.0 4.5 MHz

Table 10. ADC FOR MEASURING VBOOST, VBB, VLED1, VLED2, VTEMP/AGP1, VTEMP/AGP2

Characteristic Symbol Conditions Min Typ Max Unit
ADC Resolution ADC_res 8 Bits
Integral Nonlinearity(INL) ADC_INL -1.5 +1.5 LSB
Differential Nonlinearity(DNL) ADC_DNL -2.0 +2.0 LSB
Full path gain error for measurements via VBB,VLEDx,VTEMP,VBOOST ADC_GAINERROR -3.25 3.25 %
Offset at output of ADC ADC_OFFSET -2 2 LSB
Time for 1 SAR conversion ADCConv 8 μs
ADC full scale for VBB measurement ADCFS_VBB 40 V
ADC full scale for VLED ADCFS_VLED 80 V
ADC full scale for VTEMP ADCFS_VTEMP 3 V
ADC full scale for Vboost ADCFS_VBOOST 80 V
VLEDx input impedance ADC_VLED_INZ 355 500 710 kΩ
VTEMP/AGPx input impedance ADC_VTAGP_INZ 1.2 3 4.5 MΩ

NCV78663

Table 11. BOOSTER

Name Symbol Conditions SPI/OTP SETTING Normal Regulation Window (Note 18) SHUTDOWN Unit
NREGL TRGT NREGH MAX
Booster output range VBOOST Range0 [0000] 19.5 24.5 30 49 V
Range1 [0001] 22 27 32.5 49
Range2 [0010] 24 29.5 35 49
Range3 [0011] 27 32 38 49
Range4 [0100] 29 35 40.5 49
Range5 [0101] 31.5 37 43.0 49
Range6 [0110] 34 40 45.5 59
Range7 [0111] 36.5 42 48 59
Range8 [1000] 39.0 45 51 59
Range9 [1001] 41.5 47 53.5 59
Range10 [1010] 44 50 56 59
Range11 [1011] 46 52 57.5 59
Range12 [1100] 48 54.5 60.5 62
Range13 [1101] 49 57 65.0 67
Range14 [1110] 52 59.5 65.5 67
Range15 [1111] 57.5 62 66.5 67

18.For further details about the booster table and definitions, please refer to the related section contained in this datasheet.

Table 11. BOOSTER (continued)

Name Symbol Booster Oscillator Frequency[2:0]
Conditions SPI/OTP Setting Min Typ Max Unit
Booster oscillator frequency OSC16M FPWMBOOST=180kHz [011] -12% 11.5 +12% MHz
FPWMBOOST=203kHz [010] 13
FPWMBOOST=227kHz [001] 14.5
FPWMBOOST=250kHz [000] 16
FPWMBOOST=273kHz [111] 17.5
FPWMBOOST=297kHz [110] 19
FPWMBOOST=320kHz [101] 20.5
FPWMBOOST=344kHz [100] 22
Booster PWM frequency FPWMBOOST =f_OSC16M/64 OSC16M is programmable in SPI/OTP

NCV78663

Table 11. BOOSTER (continued)

Name Symbol Boost_ctrl_rate[2:0]
OTP Setting Only Min Typ Max Unit
Booster control rate Boost_ctrl_rate [011] -12.5% 86 +12.5% μs
[010] 144
[001] 240
[000] 400
[111] 667
[110] 1111
[101] 31
[100] 52

Table 12. BOOSTER PRE−DRIVER

Name Symbol Min Typ Max Unit
High-side switch impedance RONHI 2.5 4 $\Omega$
Low-side switch impedance RONLO 2.5 4 $\Omega$

Table 13. BOOSTER − CURRENT LIMITATION

Name Symbol Min Typ Max Unit
Current limitation threshold voltage VLIMTH Over full operating range 78 100 122 mV
VLIMTH_hot At $T_{J}=160^{\circ}C$ 85 100 115 mV
Threshold voltage hysteresis VLIMHYS 5 10 20 mV
Sense voltage common mode range CMVSENSE -1 1 V

Table 14. ON−CHIP TEMPERATURE SENSOR Name Symbol

\mathsf{A t},\mathsf{T}{}_{\mathsf{J}}=160\ {}^{\circ}\mathsf{C}

Name Symbol Min Typ Max Unit
On resistance RDS(on) 0.82 1.0 Ω
Overcurrent detection OCD 1.4 3 A
Switching slope Trise 3 V/ns
Tfall 3 V/ns

NCV78663

Table 16. BUCK REGULATOR − CURRENT REGULATION

Name Symbol Min Typ Max Unit
Current sense comparator threshold voltage setpoint(= end of the BUCK ON-phase) MIN value VThreshold_MIN Programmable with 7-bit resolution internal DAC(bit code0=[00000000]) 25 30 35 mV
Current sense comparator threshold voltage setpoint(= end of the BUCK ON-phase) MAX value VThreshold_MAX Programmable with 7-bit resolution internal DAC(bit code127=[11111111]) 370 411 451 mV
Current comparator threshold voltage setpoint step(internal DAC resolution) Delta VThreshold 3 mV
Name Symbol SPI/OTP SETTING Min Typ Max Unit
Smallest Toff x VLED constant Toff_V_1 [0000] Value on the right represents(VLED*Toff_i)VLED=55V和TJ=155℃ 9.9 12.4 14.9 μs x V
Toff_V_2 [0001] 19.8 24.5 29.2
Toff_V_3 [0010] 39.6 45.9 52.2
Toff_V_4 [0011] 57 66.6 76.2
Toff_V_5 [0100] 76.4 88 99.6
Toff_V_6 [0101] 96.2 110 123.8
Toff_V_7 [0110] 116.8 132 147.2
Toff_V_8 [0111] 135.8 154 172.2
Mid range off-time(trimmed@VLED=55V) Toff_V_9 [1000] 154.5 176 197.5
Toff_V_10 [1001] 173.2 198 222.8
Toff_V_11 [1010] 191.8 220 248.2
Toff_V_12 [1011] 210.6 242 273.4
Toff_V_13 [1100] 229.1 264 298.9
Toff_V_14 [1101] 248 286 324
Toff_V_15 [1110] 266.4 308 349.6
Longest off-time Toff_V_16 [1111] 283.3 330 376.2
Off-time=f(VLED) Toff_V_i VLED>5.4V Toff_i*VLED=CONST μs x V
6V<VLED<55V and Tjis fixed CONST-8.5% Toff_i*VLED=CONST CONST+8.5% μs x V
10V<VLED<55V and Tjis fixed CONST-7% Toff_i*VLED=CONST CONST+7% μs x V
-45°C<Ti<155°Cand VLEDis fixed Toff_i*VLED=CONST±4% μs x V

T_{j}=155^{\circ}C

1.9,\lor\leq\lor\ \ {sf L L E<22.6,V\lor}

-45^{\circ}\mathbb{C}{<}\mathbb{T}{<}155^{\circ}\mathbb{C}

\mathsf{V L E D}<1.9,\mathsf{V}


NCV78663

Table 17. 5 V TOLERANT DIGITAL INPUTS (CSB, SDI, SCLK)

Name Symbol Min Typ Max Unit
High-level input voltage VINHI 2 V
Low-level input voltage VINLO 0.8 V
Input leakage resistance Rpull(Note 19) 5 10 20 kΩ

\mathsf{T p}

\mathsf{R}_{\mathsf{p u l l}}\left(\mathsf{N o t e}\ 19\right)

19.Pull down resistor (Rpulldown) for SDI and SCLK, pull up resistor (Rpullup) for CSB.

Table 18. 5 V TOLERANT OPEN−DRAIN DIGITAL OUTPUT (SDO)

Name Symbol Min Typ Max Unit
Low-voltage output voltage VOUTLO ISDO_out=-10mA(current flows into the pin) 0.4 V
Equivalent output resistance RDS(on)_DIAG Lowside switch 20 40 Ω

\mathsf{T p}

1_{\sf O D O0t t t}=-10,\sf m A

\mathsf{R_{D S(o n)_D D G}}

Table 19. 3 V TOLERANT DIGITAL INPUTS (TEST1, TEST2)

Name Symbol Min Typ Max Unit
High-level input voltage VINHI 2 V
Low-level input voltage VINLO 0.8 V
Input leakage resistance Rpulldown Pulldown resistance 20 40 kΩ

\mathsf{R}_{\mathsf p u l l d o w n}

Table 20. 3 V PUSH−PULL DIGITAL OUTPUTS (DIAG1, DIAG2)

Name Symbol Min Typ Max Unit
High-level output voltage VOUTHI $I_{DIAG_out}=10\text{mA}$ (current flows out of the pin) 2.4 V
Low-voltage output voltage VOUTLO $I_{DIAG_out}=-10\text{mA}$ (current flows into the pin) 0.4 V
Equivalent output resistance RDS(on) Lowside switch 20 40 $\Omega$

\mathbf{T y p}

1_{\sf O I A G_o u t}=10,{\sf m A}

Table 21. 40 V TOLERANT DIGITAL INPUTS (LEDCTRL1, LEDCTRL2)

Name Symbol Min Typ Max Unit
High-level input voltage VINHI 0.7xVBB V
Low-level input voltage VINLO 0.3xVBB V
Input leakage current ILEAK -1 1 μA

\ \mathrm V{{\bf{B}}}


NCV78663

Table 22. DIMMING INTERFACE

Name Symbol Min Typ Max Unit
Input dimming frequency FDIMMING 50 1000 8000 Hz
Dimming signal input measurement and output reconstruction resolution DIMres_IN_OUT 10 μs
Dimming Frequency Factor(=Output dimming frequency/input dimming frequency) DFF[2:0] SPI/OTP setting [100] 1
SPI/OTP setting [101] 2
SPI/OTP setting [110] 3
SPI/OTP setting [111] 4
SPI/OTP setting [000] 5
SPI/OTP setting [001] 6
SPI/OTP setting [010] 7
SPI/OTP setting [011] 8

NCV78663

Table 23. SPI INTERFACE

Name Symbol Min Typ Max Unit
SPI clock period tCLK 1 μs
SPI clock high time tCLK_HI 100 ns
SPI clock low time tCLK_LO 100 ns
SDI set up time, valid data before rising edge of CLK tSET_DI 50 ns
SDI hold time, hold data after rising edge of CLK tHOLD_DI 50 ns
CSB high time tCS_HIGH 2.5 μs
CSB set up time, CSB low before rising edge of CLK tSET_CSB 1 μs
CLK set up time, CLK low before rising edge of CSB tSET_CLK 100 ns
Delay time from falling edge of CSB to a valid DO signal TdCSB_DO 50 ns
Delay time from falling edge of CLK to a valid DO signal TdCLK_DO 50 ns

Figure 5. SPI Timing


NCV78663

DETAILED OPERATING AND PIN DESCRIPTION

SUPPLY CONCEPT IN GENERAL Low operating voltages become more and more required

Low operating voltages become more and more required due to the growing use of start stop systems. In order to

respond to this necessity, the NCV78663 is designed to support power−up with a minimum guaranteed VBB = 5 V.

{\bf V}_{\mathrm{B B}}=5\ {\bf V}.

Figure 6. Cranking Pulse (ISO7637−1): System has to be Fully Functional (Grade A) from Vs = 5 V to 28 V

VDRIVE Supply The VDRIVE supply voltage is the primary supply for the

\ _s55

The VDRIVE supply voltage is the primary supply for the complete chip and sustains the VREG3V (which provides the VDD voltage, used by the internal circuitry) and the BOOST PREDRV, which generates the VGATE, used to switch the booster MOSFET. In order to support low VBB battery voltages and long

In order to support low VBB battery voltages and long crank pulse drops, the VDRIVE supply takes its energy from the source with the highest output voltage, either from: ♦ the VREG10V supply, which derives its energy

♦ the VREG10V supply, which derives its energy from the VBB input. ♦ the VBOOST_AUXSUP, which gets its energy from

Note: Powering the device via the VBOOST_AUXSUP will produce an extra power dissipation linked to the related linear drop (VBOOST−VBOOST_AUXSUP), which must be taken into account during the thermal design.

♦ the VBOOST_AUXSUP, which gets its energy from the VBOOST path. Under normal operating conditions, VREG10V is the

the VBOOST path. Under normal operating conditions, VREG10V is the highest and all the internal device plus gate driver energies are supplied via VBB. At power−up, the VREG3V (for VDD) is supplied

\mathrm{V B B}\geq5;\mathrm{V}

At power−up, the VREG3V (for VDD) is supplied through the VREG10V from the VBB input pin. Due to the low drop−out, the chip starts up from VBB ≥ 5 V and, the boost voltage starts to build−up. In case VBB drops below the regulator margin of

VDD Supply The VDD supply is the low voltage digital and analog

The VDD supply is the low voltage digital and analog supply for the chip and takes energy from VDRIVE. Due to the low drop−out regulator design, VDD is guaranteed already from low VDRIVE voltages (see Table 7). The Power On Reset circuit (POR) monitor is based on the VDD voltage.

VBOOSTM3V Supply The VBOOSTM3V is the high side auxiliary supply for

The VBOOSTM3V is the high side auxiliary supply for the gate drive of the buck regulators’ integrated high−side P−MOSFET switches. This supply receives energy directly from the VBOOST pin.

INTERNAL CLOCK GENERATION Two internal clocks are fully internally generated without

INTERNAL CLOCK GENERATION Two internal clocks are fully internally generated without the need for any further trimming by the user. Their accuracy is guaranteed under full operating conditions and independent from external component selection.

OSC16M Clock The OSC16M clock is the booster reference clock. It is

OSC16M Clock The OSC16M clock is the booster reference clock. It is factory trimmed and user selectable between typical 11.5 MHz and 22 MHz. The booster PWM frequency is 1/64 of the OSC16M frequency, thus between 179.7 kHz and 343.8 kHz. Refer to Table 11 for accuracy details.


ADC

General The built−in analog to digital converter (ADC) is an 8−bit

The built−in analog to digital converter (ADC) is an 8−bit capacitor based successive approximation register (SAR). This embedded peripheral can be used to provide the

This embedded peripheral can be used to provide the following measurements to an external Micro Controller Unit (MCU): VBOOST voltage

♦ VBOOST voltage VBB voltage

♦ VBB voltage VLED1, VLED2 voltages

♦ VLED1, VLED2 voltages VTEMP_AGP1, VTEMP_AGP2 voltages

♦ VTEMP_AGP1, VTEMP_AGP2 voltages The internal NCV78663 ADC state machine samples all

The internal NCV78663 ADC state machine samples all the above channels automatically, taking care for setting the analog MUX and storing the converted values in memory. The device LED diagnostics and the digital boost controller make use of the values as inputs. To remark that the VLEDx (1, 2) lines are sampled only

To remark that the VLEDx (1, 2) lines are sampled only when the respective LED output is activated and the last sampled value is kept, until it is overwritten (refreshed) by a new one. An external MCU can read−out all measured values via

An external MCU can read−out all measured values via the SPI interface in order to take application specific decisions. Please note that the MCU SPI commands do not interfere with the internal ADC state machine sample and conversion operations: the MCU will always get the last available data at the moment of the register read. Each new boost voltage sample occurs at 17 s worst case

Each new boost voltage sample occurs at 17 s worst case rate. VLED1 and VLED2 voltages are typically sampled at a rate of about 52 s (when the buck switches are on), while VTEMP_AGP1 and VTEMP_AGP2 are continuously sampled at a rate of 4 ms. The battery voltage is sampled typically each 108 s. ADC Channel Selection

ADC Channel Selection The ADC channel selection readout is done via the

ADC_SEL[2:0] VBOOST VBB VLED1 VLED2 VTEMP_AGP1 VTEMP_AGP2
000 1 0 0 0 0 0
001 0 1 0 0 0 0
010 0 0 1 0 0 0
011 0 0 0 1 0 0
100 0 0 0 0 1 0
101 0 0 0 0 0 1
110 Do not select
111 Do not select

The ADC channel selection readout is done via the SPI-CR11 register (the part “ADC_Sel” behaves as a pointer to the requested data), while the SPI−SR3 registers will hold the data (see section SPI Address Map). When polling the same channel over time, there is no need to refresh the address field, as the SPI−SR3 register will be automatically refreshed with the latest available data.

Battery Voltage ADC Measurement The battery voltage is sampled making use of the device

The battery voltage is sampled making use of the device supply VBB−pin. This measurement is also used by the boost controller for the closed loop voltage regulation to set the maximum duty cycle depending on the battery level: the lower the level, the higher the maximum duty cycle allowed. The (8 bit) conversion ratio is 40/255 (V/dec) =

lower the level, the higher the maximum duty cycle allowed. The (8 bit) conversion ratio is 40/255 (V/dec) = 0.157 (V/dec) typical. The external MCU can make use of the measured VBB value to monitor the status of the module supply and also for a different or more complex power de−rating algorithm than the one embedded in the NCV78663 (see Section Automatic Power De−rating). LED String Voltage ADC Measurement

LED String Voltage ADC Measurement The voltage at the pins VLEDx (1, 2) is measured. Their

The voltage at the pins VLEDx (1, 2) is measured. Their 8 bit conversion ratio is 80/255 (V/dec) = 0.318 (V/dec) typical. This is also used by the diagnostics controller to detect

This is also used by the diagnostics controller to detect OpenLEDx, ShortLEDx and IndShortLEDx. The external MCU can use the measured VLED value for

The external MCU can use the measured VLED value for a dedicated individual short LED algorithm, more complex than the threshold decision based embedded in the LED DRIVER.

LED Temperature Feedback / ADC General Purpose Inputs Measurement Measures the voltage at the pins VTEMP/AGPx (1,2).

Measures the voltage at the pins VTEMP/AGPx (1,2). The typical application would be sensing the transducer

The typical application would be sensing the transducer voltage related to LED modules’ temperature, so that the external MCU can use the information for protecting the LED strings from overheating, or to adapt the luminous flux to the temperature. A common technique is to use an NTC pulled up to the chip VDD. The VTEMP/AGPx typical sample rate is 4 ms. Please

The VTEMP/AGPx input dynamic range is given by the VDD voltage and no higher value can be forced to these pins.


NCV78663

Boost Voltage ADC Measurement This measure refers to the boost voltage at the

Boost Voltage ADC Measurement This measure refers to the boost voltage at the VBOOST−pin, with an 8bit conversion ratio of 80/255 (V/dec) = 0.318 (V/dec) typical. This measurement is also used by the boost controller and by the diagnostics controller to detect Boost under−voltage (BoostUV).

BOOST CONTROLLER The NCV78663 features one common booster stage for

The NCV78663 features one common booster stage for the two integrated buck current regulators. In addition, optional external buck regulators belonging to other devices can be cascaded to the same boost voltage source as well as exemplified in the picture below.

Figure 7. Cascade of Multiple NCV78663 Buck Channels on a Common Boost Voltage Source

current in case of LED strings PWM dimming. For nominal loads, the boost controller will regulate in continuous mode of operation, in order to maximize system power efficiency and to have the lowest possible input ripple current (with “continuous mode” it is meant that the supply current does not go to zero while the load is activated). In case of low loads or low dimming duty cycle values,

In case of low loads or low dimming duty cycle values, discontinuous mode can occur: this means the supply current

can swing from zero when the load is off to the required peak value when the load is on, while keeping the required input average current through the cycle. In such situations, the total efficiency ratio may be lower than the theoretical optimal. However, as also the total losses will at the same time be lower, there will be no impact on the thermal design.

The duty cycle (DC) is obtained internally out of a 6−bit counter (DC = 0 63). DC = 63 corresponds to duty cycle

The regulation feedback is mainly based on the VBOOST sampled value itself and only partially on the battery value seen at the device pin (VBB). Both signals are sampled by the NCV78663 internal ADC in the way described in the relative section. The boost voltage is regulated with a fixed frequency / variable duty cycle scheme. The duty cycle (DC) is obtained internally out of a 6−bit

Booster Voltage Range Selection The boost voltage can be programmed in one of the

The boost voltage can be programmed in one of the sixteen (16) available ranges by means of the SPI register booster output range [3:0] (or OTP in NCV78663 stand alone mode). Each of the ranges has its typical regulation level, called target (VBOOST_TRGT) and a so defined normal regulation region, or “window 1”, whose limits are NREGL and NREGH. In normal regulation mode, the boost voltage VBOOST

In normal regulation mode, the boost voltage VBOOST time average will always match the target, while its instantaneous value is free to swing between NREGL and NREGH. The absolute maximum voltage for each range is defined

The absolute maximum voltage for each range is defined as shutdown level (VSHUTDOWN). For VBOOST ≥ VSHUTDOWN, the MOSFET PWM (VGATE) will be switched off. The shutdown level can be chosen to minimize the needed voltage rating (size/cost) of the externals. The range should be selected with the appropriate NREG

The range should be selected with the appropriate NREG levels for the application. In particular, for proper operation of the LED strings, the selected boost voltage range “xx” must be such that NREGL_xx is higher than the maximum LED string voltage used. More information about the boost control loop is given in

Figure 8. NCV78663: Boost Voltage Regulation Closed Loop

More information about the boost control loop is given in the following section.

Booster Regulation Closed Loop Details The NCV78663 features a digital voltage mode controller

Booster Regulation Closed Loop Details The NCV78663 features a digital voltage mode controller designed to regulate the boost voltage around the target defined by the selected range. This closed loop system samples feedback signals and drives the boost MOSFET gate by PWM as shown in the next figure.

100% and DC = 0 corresponds to duty cycle 0%. However, 100% is never allowed and the maximum duty cycle corresponds to a parameter defined as DCmax. In addition, except in case of shutdown, the duty cycle is low−bounded to a value called DCmin, which is hard coded to value of “4” (4/63 = 6.3%) and is the same for all selectable booster ranges.

\mathbf{D C}_{\mathrm{m i n}}


NCV78663

DCmax is fetched from an internal ROM table and depends on the sampled battery voltage, this last divided in ranges. The general rule is the higher the battery voltage, the lower the DCmax allowed. This is intended to reduce boost voltage and input current overshoots when the battery voltage goes

\mathrm{D C_{m a x}}

\mathrm{D C_{m a x}}

\mathrm{D C_{m a x}}

too high. For low battery voltages, the DCmax is increased to permit more current inflow to allow achieving the required output power. The DCmax value 61 (96.8%) is never exceeded even in case of ultra−low battery. Eight battery ranges are available as shown below:

\mathrm{D C_{m a x}}

Eight battery ranges are available as shown below:

Table 24. NCV78663 BATTERY RANGES FOR BOOST CONTROLLER

VBB_RNG0 VBB_RNG1 VBB_RNG2 VBB_RNG3 VBB_RNG4 VBB_RNG5 VBB_RNG6 VBB_RNG7
0÷5V 5÷10V 10÷16V 16÷20V 20÷24V 24÷30V 30÷35V 35÷40V

0\div5,

10\div16V

16\div20V,

20\div24,

30\div35V

Each Vboost ADC sample is compared within voltage sections called “windows”. For each selected range, four different windows, plus a shutdown safety level, are present: A. Window 0. This is one of the “normal modes” of

A. Window 0. This is one of the “normal modes” of the control law. When the sampled Vboost falls in this region, there is no change in the PWM duty cycle. For all boost ranges, the width of this window is 2 V. The central value of this window is corresponding to VBOOST_TRGT, reported in the middle column of Table 11. B. Window 1. This is the most frequent status of the

B. Window 1. This is the most frequent status of the control law and this is what we refer to simply as general “normal mode”. When in this region, the PWM is corrected by “±1dec” (= ±1.58%) with a cadency corresponding to the boost control rate. The sign of the correction will be “plus” if the voltage is below window 0; “minus” otherwise. Each correction is intended to bring Vboost towards the VBOOST_TRGT. The size of any window 1, ranging in Table 11 from NREGL to NREGH, is typically about 10 V. C. Window 2. When in this region, the PWM duty is

\ {mathrm`}\pm1\mathrm{d e c}(=\pm1.58%)

C. Window 2. When in this region, the PWM duty is adapted by “±2” (= ±3.17%) with a cadency corresponding to the boost control rate, with the intention to bring Vboost towards the target. As the distance from the target is higher than in point B., the correction is stronger. D. Window 3. When in this range the controller

D. Window 3. When in this range the controller works in limitation mode. The PWM duty cycle is rapidly modified every two PWM periods: in the upper threshold, the duty cycle is decreased towards the DCmax trying to avoid reaching the shutdown level, whereas in the lower threshold side the duty cycle is ramped up towards the DCmin “pumping in” energy from the supply to avoid LED blank out because of lack of voltage headroom. E. Shutdown. This is a safety level to avoid

^{4}\pm2^{7},(=\pm3.17%)

\ \mathrm{:D C_{m a x}}

Table 11. Note: this “MAX rating” corresponds also to the maximum booster output voltage in case of unloaded stage (buck regulators off). A graphical explanation is given in the figure below by

A graphical explanation is given in the figure below by referring to boost range 06 as an example.

REMARKS and PRACTICAL CONSIDERATIONS For a well sized booster system with the NCV78663, the

For a well sized booster system with the NCV78663, the controller will operate inside window 1 (or window 0), thus:

\sf{V} {B O O S T_r R a T T}-\sf{s vee\nu}<\sf{V}{B O O s T}<\sf{V}_{B O O s T_r R a T T}+\sf{s}\ \sf{V}

An exception might be at booster load start−up, when its output power passes for the first time from zero (unloaded) to maximum (application target). In this case, the voltage is allowed to drop in the low threshold of window 3 and after a first settling transient, the regulation will enter normal mode (window 1).


NCV78663

Figure 10. NCV78663: Boost Voltage Possible Behavior at First Full Power Load Activation

In order to guarantee the regulation in WINDOW 1 throughout operating conditions and dimming, a total boost capacitance Cboost ≥ 50 F is recommended for medium to high application power. For further details about capacitance sizing, please refer to application notes. Please note that the boost voltage regulation loop is not

\geq50,\upmu\mathfrak{F}

Please note that the boost voltage regulation loop is not affected whether a continuous or discontinuous mode of operation (E.G. low dimming duty cycle) is taking place.

Booster PWM Frequency The booster controller is working with a constant

The booster controller is working with a constant frequency and variable duty cycle to control the booster voltage. The operating frequency is user selectable with three

The operating frequency is user selectable with three SPI/OTP setting bits (Section OSC16M Clock), in order to optimize the booster inductor’s size and EMC aspects.

Booster Disable Function In some cases, it is useful to disable the booster by means

♦ the NCV78663 uses a shared booster from another device, it is desired to start the hardware module from a

\mathrm{V_{L E D}}

External Boost FET Pre−driver The external boost MOSFET is directly controlled by the

♦ it is desired to start the hardware module from a complete off state, or to minimize energy consumption in some particular operating modes.

The external boost MOSFET is directly controlled by the integrated pre−driver with slope−control to attenuator EMC emissions. Due to the cycle by cycle current limitation, the peak−currents in the MOSFET are reduced, resulting in optimized system efficiency. Also for efficiency reasons, it is important to select a MOSFET with low gate−charge. The pre−driver is supplied by the VDRIVE supply

The pre−driver is supplied by the VDRIVE supply (typical 10 V) supporting standard FETs.

Figure 11. Buck Regulator Controlled Average Current

The buck regulator is the current source to the LED string. This block controls the peak current and also incorporates a constant ripple control circuit to ensure also stable average current through the LED string. The formula that defines the total ripple current over the

Buck Regulator The buck regulator is the current source to the LED string.

The formula that defines the total ripple current over the buck inductor is hereby reported: T (V V

\begin{array}{r l}{\Delta\mathsf{I} {\tt{B U C K_p k p p}}=\ }{{tttt}}&\frac{\mathsf{T}{\tt{F F F}}\times\ (\mathsf{V} {\tt{L E D}}+\mathsf{V}{\tt{D U O E E}})}\ {\ \

In the formulas above TOFF represents the buck switch off time, VLED is the LED voltage feedback sensed at the NCV78663 pin and LBUCK is the buck inductor value.

\mathrm{V_{L E D}}


NCV78663

\begin{array}{r}{\mathsf{f} {\tt B U B C K}=\frac{\mathsf{V}{\tt B O O S T}-\mathsf{V} {\tt L E D}}{\mathsf{V}{\tt B O O S T}}\cdot\frac{1}{\mathsf{T} {\tt O F F}}=}\ {=\frac{\mathsf{V}{\tt B O O S T}-\mathsf{V} {\tt L E D}}{\mathsf{V}{\tt B O O S T}}\times\frac{\mathsf{V} {\tt L E D}}{\mathsf{T}{\tt O F F}_{_\_V U C L}.}}}\end{array}

The buck average current is described by the formula:

\mathsf{I} {\mathsf{B U C K_p e a k}}=\frac{\mathsf{V}{\mathsf{T h r e s h o l d}}}{\mathsf{R}_{\mathsf{S E N S E}}},

Isf_{B U C K_A V G}=sf I I_{B U C K_p e a k}-\frac{\Delta I_{B U C K_p k p k}}{2}.

The parameter IBUCK_peak is programmable through the device by means of the internal comparator threshold (Table 16) over the external sense resistor RSENSE:

where Vthreshold is the current comparator internal set−point reference (Table 16).

\mathrm{V_{t h r e s h o l l}}

\begin{array}{c}{{\sf{V}} {\sf{T h r e s h o l d}}={\sf{V}}{\sf{T h r e s h o l d_M l N}}+{\sf{D e l t a_V_{r h r e s h o l d}}}\times}\ {{\ \\ \\ \\ \\ \\ times\ {u u r e e t_S e t i n g_\ P I P(d e c)}}.}\end{array}

The item “Current_setting_SPI (dec)” corresponds to the value written in the related for the “x” string, programmable from 0 to 127 (7bits). Please refer to Tables 26 and 27 for more information. The full buck circuit diagram follows:

The full buck circuit diagram follows:

Figure 12. Buck Regulator Complete Schematics

Independently from the peak current setting, there is also an overcurrent detection (fixed threshold) which is measured over the internal buck MOSFET. See Table 15. The LED average current in time is equal to the buck time

Figure 13. LED Current AC Components Filtered Out By the Output Impedance (scope snapshot)

For what concerns the LED ripple current, this is defined by the Buck inductor ripple current, the buck capacitor and

the total LED string equivalent impedance. A rule of thumb is to count a minimum of 50% ripple reduction by means of the capacitor CBUCK and this is normally obtained with a ceramic component ranging from 100 nF to 470 nF. The following figure reports a typical example. The use of CBUCK is a cost effective way to improve EMC performances without the need to increase the value of LBUCK, which would be certainly a more expensive action.


NCV78663

DIMMING The chip supports both analog and digital or PWM

The chip supports both analog and digital or PWM dimming. Analog dimming is done by controlling the LED current during operation. This can be done by means of changing the peak current level and/or the Toff_V constants (see Buck Regulator − Current regulation) by SPI commands.

In this section, we only describe the PWM dimming as this is the preferred method to maintain the desired LED color temperature for a given current rating. In digital dimming, the LED current waveform frequency

In digital dimming, the LED current waveform frequency is constant and the duty cycle is set according to the required light intensity. The two independent control inputs LEDCTRLx handle the dimming signals for the related channel. More details in the following section.

Dimming Control Scheme

Figure 14. NCV78663 Internal Digital (PWM) Dimming Structure

The dimming signal of each LED string is controlled via the respective LEDCTRLx input; the PWM there applied is sampled and converted into an output PWM signal used for enabling the buck channel driving the LEDx string (the internal buck MOSFET enabled signal is called BUCK_ENx). The BUCK_ENx signal frequency is obtained

The BUCK_ENx signal frequency is obtained multiplying the input frequency by the Dimming Frequency Factor (DFF). Increasing the dimming frequency is very useful to avoid the beats effect. In addition, higher dimming frequency reduce the dimming boost voltage swings for a given output booster capacitor. The BUCK_ENx duty cycle is equal to the input duty

given output booster capacitor. The BUCK_ENx duty cycle is equal to the input duty cycle times the internal scaling factors: the Dimming Duty Factor (DDF) and the Dimming Derating Factor (DRF). This last is automatically set by the device in case a power de−rating condition is occurring (see section Automotive Power De−rating). The DRF is applied to both channels simultaneously. The DDFx is instead individually programmable for each

\mathsf{D u t y F a c t o r_{x}=100\times\frac{255-D D F_{S P l_R E a x}}{255}}

\mathsf{D D F}_{\mathsf P P\__ E E G x}=255\times\frac{100-\mathsf{D u H y F a t o r r}{x}}{100}

or equivalently:

The following formula summarizes the effects on the dimming duty cycle for the LED STRING “x”: BuckENx DutyIN DutyFactor DRF

To detect an input duty cycle of 100% (“long one” = LEDx continuously ON), an input period higher than 40 ms is

\ {\sf u u c k E N x} {\sf D U T Y}=\ \sf{D u t y I N}{\sf L E D C T R I x}\times\ {\sf D u n y F a c t o r}_{x}\times\ {\sf D H F}

Where DutyINLEDCTRLx represents the input duty cycle provided by the external logic (or MCU) at the LEDCTRLx input. As the input signal at the LEDCTRLx is sampled by the


NCV78663

required. Vice versa, starting from a 100% duty cycle condition, in order to detect a 0% input signal (LEDx continuously OFF), up to 2 ms may be required. Using a 100% input duty cycle will by nature remove the

Using a 100% input duty cycle will by nature remove the external dimming frequency reference to the device. In such a case, if a duty cycle scaling (DDFx or DRF) is active, the internal frequency dimmer timer is used. Its base frequency is 500 Hz x DFF. This feature can be exploited as a method to avoid the use of an external frequency generator even when dimming is really intended: an hint for the application is then to tie (or pull up) the LEDCTRLx pins to the VBB pin and to set the wanted dimming parameters just by means of SPI. A DDFx = 0% (255dec) will always secure to turn off the LEDx strings across operating conditions. To note how the time resolution of both the input

To note how the time resolution of both the input LEDCTRLx sampler and the BUCK_ENx output reconstructed signals is 10 s nominal (see Table 22): this

value corresponds to the smallest resolution obtainable for digital dimming.

Automatic Power De−rating The LED output power can be automatically de−rated by

The LED output power can be automatically de−rated by decreasing the calculated output duty cycle in case of detected extreme conditions: either low battery voltage or active on−chip Thermal Warning. The NCV78663 features an embedded automatic power

The NCV78663 features an embedded automatic power derating function based on the battery voltage which can be enabled or disabled by OTP/SPI (PWRDERATE_DIS bit, see SPI map). The battery voltage measurement is automatically performed by the device sampling of the VBB pin. In case a protection diode in front of the VBB is used, its voltage drop and the discharge delay of the external capacitor in parallel to the pin have to be taken into account. The V_BAT power derating is implemented according to the graph below:

86%\times75%=

Figure 15. NCV78663 Internal V_Bat Power Derating Profile

simultaneously. In case of on−chip Thermal Warning, the calculated output duty cycle is further scaled to 75% of its previous calculated value (thermal derating). Then when the junction temperature falls below the Thermal Warning level, the thermal de−rating condition is automatically exited. The warning bit in SPI status register remains activated until reset via an SPI read−command. Example: V_Bat de−rating and thermal derating occurring

When the de−rating condition disappears the output duty will go back to 100% of the calculated output duty. The de−rating process is applied on both led channels simultaneously. In case of on−chip Thermal Warning, the calculated

SPI INTERFACE

The NCV78663 SPI transfer packet size is 16 bits. During an SPI transfer, the data is simultaneously transmitted (shifted out serially) and received (shifted in serially). A serial clock line (CLK) synchronizes shifting and sampling of the information on the two serial data lines: SDO and SDI.

The serial peripheral interface (SPI) is used to program the default start−up operating parameters in OTP via the ZAP! operation. Optionally, it allows an external microcontroller (MCU) to communicate with the device to read−out status information and to change operating parameters after power−up. The NCV78663 SPI transfer packet size is 16 bits. During an SPI transfer, the data is simultaneously transmitted


NCV78663

The DO signal is the output from the Slave, and the SDI signal is the output from the Master. A slave select line (CSB) allows individual selection of a slave SPI device in a time multiplexed multiple−slave system. The CSB line is active low. If an NCV78663 is not selected, SDO is in high impedance state and it does not interfere with SPI bus activities. Since NCV78663 always clocks data out on the

falling edge and samples data in on rising edge of clock, the MCU SPI port must be configured to match this operation. The SPI CLK idles low between transferred frames. The diagram below is both a master and a slave timing diagram since CLK, DO and DI pins are directly connected between the Master and the Slave.

Figure 16. NCV78663 SPI Transfer Format

Note: The data transfer from the shift register into the locally used registers, interpretation of the data is only done at the rising edge of CSB. The Data that is send over to the shift register to be

The Data that is send over to the shift register to be transmitted to the external MCU is sampled at the falling edge of CSB, just at the moment the transmission starts. The implemented SPI block allows interfacing with

edge of CSB, just at the moment the transmission starts. The implemented SPI block allows interfacing with standard MCUs from several manufacturers. When interfaced, the NCV78663 acts always as a Slave and it cannot initiate any transmission. The MCU is instead the master, able to send read or write commands. The NCV78663 SPI allows connection to multiple slaves by

means of both star connection (one individual CSB per Slave, while SDI, SDO, CLK are common) or by means of daisy chain (common CSB signal and clock, while the data lines are cascaded as in the figure). An SPI star connection requires a bus = (3 + N) total lines, where N is the number of Slaves used, the SPI frame length is 16 bits per communication. Regarding the SPI daisy chain connection, the bus width is always four lines independently on the number of slaves. However, the SPI transfer frame length will be a multiple of the base frame length so N x 16 bits per communication: the data will be interpreted and read in by the devices at the moment the CSB rises.

Transfer Format All SPI commands (to SDI pin of NCV78663) from the

The address/command byte is the MSB and is divided into two nibbles (2 x 4 bits). Each nibble is an address pointing to the 16 bytes address space of the NCV78663 SPI register map (see related section) and in the same time it is interpreted also as a command (explanation given below). Two types of registers exist in the SPI address space: Control and Status registers. Control registers are read/write

Figure 17. NCV78663 SPI Star vs. Daisy Chain Connection

SPI Daisy chain connection

accessible whereas Status registers are only read accessible. The type of the register is determined by the address decoder of the SPI and depends on its position in the address space. Three command−types can be distinguished: “Write to a

♦ Writing to a control register is accomplished only if the address of the target register appears in the upper address/command nibble. The contents of the data−byte will be copied in the control register.


NCV78663

♦ Reading from a control register is accomplished by putting its address in the lower address/command nibble. The data byte has no function for this command. ♦ Reading from a status register is accomplished by

command. ♦ Reading from a status register is accomplished by putting its address either in the upper or in the lower

address/command nibble. The data byte has no function for this command. The response (SDO) on the commands from the first

The response (SDO) on the commands from the first frame is always two bytes long and is located in the subsequent SPI frame. The possible combinations of SDI/SDO and their use are summarized in the following table:

Table 25. SPI FRAME FORMAT TRANSFER

ID NCV78663 received input: SDI NCV78663 response: SDO
SPI 16bit Frame 01MSB high-nibble SPI 16bit Frame 01MSB low-nibble SPI 16bit Frame 01LSB SPI 16bit Frame 02 MSB SPI 16bit Frame 02LSB Comments
ADDR_CMD[7:4] ADDR_CMD[3:0] DATA[7:0] ADDR_CMD[7:0] DATA[7:0]
1 ACR1 ACR2 DICR1 DOCR1 DOCR2 Write to CR1 content of data field(DICR1)and readCR2
2 ACR1 ASR1 DICR1 DOCR1 DOSR1 Write to CR1 content of data field(DICR1)和读ASR1
3 ASR1 ACR1 XXh DOSR1 DOCR1 Read both ASR1和ACR1
4 ASR1 ASR2 XXh DOSR1 DOSR2 Read both ASR1和ASR2

LEGENDA: ACRx = Address of Control Register x

♦ ACRx = Address of Control Register x ASRx = Address of Status Register x

♦ ASRx = Address of Status Register x DICRx = Data Input of Control Register x

♦ DICRx = Data Input of Control Register x ♦ DOCRx/DOSRx = Data Output of corresponding Register.

♦ DOCRx/DOSRx = Data Output of corresponding Register. XXh = any byte

{\mathrm{X X h}}={\mathrm{a n y,b t e}}

SPI Command Example: Write “data value 255” (= 0xFF hex) to control register at “address 1” (= 0x01 hex) and read control register at “address 4” (= 0x04 hex)

255^{\circ},(=0x F\mathrm{,h e x})

1^{},(=0\0\ \mathrm01,\mathrm{h e x})

4^{\ },(=0\ \mathrm{x004,\ emathrm{x x}))

Frame01(16bit) Frame02(16bit)
MSB:HighNibble MSB:LowNibble LSB MSB(dummy/NOP) LSB(dummy/NOP)
0 0 0 1 0 1 0 0 1 0 1 0 1 0 1 1 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
Frame01(16bit) Frame02(16bit)
MSB LSB MSB LSB(dummy/NOP)
Response from past command or not valid data out-of-reset Response from past command or not valid data out of reset 1 0 1 0 1 0 1 1 Content of register 0x04

NOTE: In any SPI communication transfer a frame which is not multiple of 16 bits is considered as an error and is discarded by the device. In case of SPI error, the specific error flag in STATUS REGISTER 2 is raised (see SPI address map).


NCV78663

SPI ADDRESS MAP

Table 26. SPI BANK REGISTER SUMMARY

SPI Address POR Value Access 7 6 5 4 3 2 1 0
0x00 0x00 - NOP
0x01 0x00 R/W Control Register 1
Dimming Duty Factor LED string 1 [7:0]
0x02 0x00 R/W Control Register 2
Dimming Duty Factor LED string 2 [7:0]
0x03 0x00 R/W** Control Register 3
OTPLockint** Current setting LED string 1 [6:0]
0x04 0x00 R/W** Control Register 4
OTPLockExt** Current setting LED string 2 [6:0]
0x05 0x00 R/W Control Register 5
LED string 1 diagnostics individual short threshold [7:0]
0x06 0x00 R/W Control Register 6
LED string 2 diagnostics individual short threshold [7:0]
0x07 0x00 R/W Control Register 7
BOOSTER_DIS Booster oscillator frequency [2:0] Booster output range [3:0]
0x08 0x00 R/W Control Register 8
Toff 1 range selection [3:0] PWRDERATE_DIS Dimming frequency factor [2:0]
0x09 0x00 R/W(TEST) Control Register 9 / OTP_Ctrl [7:0]
OTP_Start* OTP_Cmd [1:0]* OTP_Addr [3:0]*
0x0A 0x00 R/W(TEST) Control Register 10
OTP_Data [7:0]*
0x0B 0x00 R/W(TEST) Control Register 11 / AdcCtrl [7:0]
Reserved* Toff 2 range selection [3:0] ADC_Sel [2:0]
0x0C 0x00 R Status Register_1
Parity bit BoostUV DCmax PWRderate OpenLED1 ShortLED1 IndShortLED1 OCLED1
0x0D 0x00 R Status Register_2
Parity bit TW TSD SpiErr OpenLED2 ShortLED2 IndShortLED2 OCLED2
0x0E 0x00 R Status Register_3
ADC [7:0]
0x0F 0x00 R/W(TEST) Test Command(write)/RevID(read)
RevID [7:0] (Note 20)

Mapped in both, SPI and OTP address maps (with different address)

*Registers with write possibility only in TEST mode (TEST1 pin = high) **Read−only registers as exception A detailed description of the SPI registers follows in the next section.

A detailed description of the SPI registers follows in the next section. 20.RevID = 7dec (= [111] bin) for QAA silicon, RevID =6dec (= [110] bin) for PAA silicon (register 0x0F).

20.RevID = 7dec (= [111] bin) for QAA silicon, RevID =6dec (= [110] bin) for PAA silicon (register 0x0F).


NCV78663

SPI REGISTERS DETAILS

Name Control Register 1 /CR1: Dimming Duty Factor String 1 (DDF1)
7 6 5 4 3 2 1 0
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 01h Access: R/W
Bit Name Description
7...0 DDF1[7:0] Dimming Duty factor configuration for LED string 1.
Name Control Register 2 /CR2: Dimming Duty Factor String 2 (DDF2)
7 6 5 4 3 2 1 0
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 02h Access: R/W
Bit Name Description
7...0 DDF2[7:0] Dimming Duty factor configuration for LED string 2.
Name Control Register 3 /CR3: Current Setting LED String 1
7 6 5 4 3 2 1 0
OTP LockInt Current Setting LED string 1
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 03h Access: R/W
Bit Name Description
7 OTPLockInt Read only register, part also of the OTP memory space. Write access only in test mode via OTP zap operation. If high, certain (indicated by the “*” symbol) set of OTP registers are protected against write/load access.
6...0 DCS1[6:0] Current Setting for LED String 1.
Name Control Register 4/CR4:Current Setting LED String2
7 6 5 4 3 2 1 0
OTP LockExt Current Setting LED String2
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 03h Access: R/W
Bit Name Description
7 OTPLockExt Read only register,part also of the OTP memory space.Write access only in test mode via OTP zap operation.If high,all OTP registers are protected against write/load access.
6...0 DCS2[6:0] Current SettingLEDstring2.

NCV78663

Name Control Register 5/CR5:LED String 1 Diagnostics Individual Short Threshold
7 6 5 4 3 2 1 0
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 05h Access: R/W
Bit Name Description
7...0 ShortThr1[7:0] LED String 1 diagnostics individual short threshold.
Name Control Register 6/CR6:LED String2 Diagnostics Individual Short Threshold
7 6 5 4 3 2 1 0
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 06h Access: R/W
Bit Name Description
7...0 ShortThr2[7:0] LED String2 diagnostics individual short threshold.
Name Control Register 7/CR7:Booster Output Range/Booster Oscillator Frequency
7 6 5 4 3 2 1 0
Booster DIS Booster oscillator frequency Booster output range
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 07h Access: R/W
Bit Name Description
7 BOOSTER_DIS Booster Disable. Default value comes from OTP memory-bit[108]
6...4 BoostOscAppCnfg[2:0] Booster oscillator frequency(related to resulting booster PWM frequency)
3...0 BoostOutRng[3:0] Booster output range.
Name Control Register 8 /CR8: Toff Range Selection / Dimming Freq. Factor
7 6 5 4 3 2 1 0
Toff range selection PWRDERATE_DIS Dimming freq. factor
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 08h Access: R/W
Bit Name Description
7...4 ToffRngSel[3:0] Toff range selection.
3 PwrDerate_DIS When‘0’(default state)power derating is enabled.
2...0 DimFreqScl[2:0] Dimming frequency factor.

NCV78663

Name Control Register 9 /CR9/ : OTP Control
7 6 5 4 3 2 1 0
OTP_Start - OTP_Cmd[1:0] OTP_Addr[3:0]
Reset Value:
0 x 0 0 0 0 0 0
Reset Source: nReset/TEST
Address: 09h Access: R/W* (in Test mode)
Bit Name Description
7 OTP_Start To write in this registers TEST pin needs to be set to '1'.
Set of OTP_Start bit executes the selected command – written in OTPCtrl [1:0] bits.
6...5 OTP_Cmd[1:0] To write in this registers TEST pin needs to be set to '1'.
"00" – Point to OTP cell (read OTP without SPI registers refresh)
"01" – Read OTP. Refresh OTP/SPI and provides for reading from OTP_DATA [7:0]
"10" – Load OTP. Take data from OTP_DATA [7:0] and shift them in the OTP chain at the OTP_Addr [3:0] address, for emulation.
"11" – Zap OTP. Take data from OTP_DATA [7:0] and zaps! the OTP, one bit at a time at OTP_Addr [3:0] address.
4 Reserved Reserved bit. To be kept to zero in the application.
3...0 OTP_Addr[3:0] Pre-defined OTP address to be accessed by the OTP_Cmd [1:0] command.
Name Control Register 10 /CR10/ : OTP Data
7 6 5 4 3 2 1 0
OTP_Data[7:0]
Reset Value:
0 0 0 0 0 0 0 0
Reset Source: nReset
Address: 0Ah Access: R/W
Bit Name Description
7...0 OTP_Data [7:0] Data used in case of OTP Load/Zap operation.
In case the register is accessed for reading, data is taken directly from OTP_Addr [3:0] address.

NCV78663

Name Control Register 11 /CR11: ADC Control
7 6 5 4 3 2 1 0
ADC_Tst_En Toff 2 range selection [3:0] ADC_Sel [2:0]
Reset Value:
0 0 0 0 0 0 0 0
Reset Source: nReset
Address: 0Bh Access: R/W
Bit Name Description
7 Reserved Reserved bit. Can be written only with test1 = high and must be kept to zero in the application.
6...3 Toff 2 range selection [3:0] Toff range selection.
2...0 ADC_Sel [2:0] Control value to the mux, selecting the channel to be measured.
Name Status Register 1 /SR1: LED1 Status
7 6 5 4 3 2 1 0
PAR BoostUV,L DCmax,L PWRderate,L OpenLED1,L ShortLED1,L IndShortLED1,L OCLED1,L
Reset Value:
0 0 0 0 0 0 0 0
Reset Source: nReset
Address: 0Ch Access: R&C
Bit Name Description
7 PAR Parity bit.
6 BoostUV Booster is in undervoltage: Vboost_ADC_Value < Vboost_UNDERVOLTAGE. A filter time of 2ms is used in booster state machine before rising BoostUV flag to SPI and the rest of the logic.
5 DCmax The duty cycle (DC) in Booster has reached DC_max limit.
4 PWRderate Dimming module is in de-rating mode.
3 OpenLED1 Open line detected at LED1 string.
2 ShortLED1 Short circuit detected at LED1 string.
1 IndShortLED1 Individual short circuit detected at LED1 string.
0 OCLED1 Over-current detected at LED1 string.

NCV78663

Name Status Register 2/SR2:LED2 Status
7 6 5 4 3 2 1 0
PAR TW,L* TSD,L SPI_ERR,L OpenLED2,L ShortLED2,L IndShortLED2,L OCLED2,L
Reset Value:
0 0 0 1 0 0 0 0
Reset Source:nReset
Address: 0Dh Access: R&C
Bit Name Description
7 PAR Parity bit.
6 TW Thermal warning event detected.
5 TSD Thermal shut event down detected.
4 SPI_ERR SPI frame not multiple of 16bits detected.
3 OpenLED2 Open circuit detected at LED2 string.
2 ShortLED2 Short circuit detected at LED2 string.
1 IndShortLED2 Individual short circuit detected at LED2 string.
0 OCLED2 Over-current detected at LED1 string.

NOTE: Flags have “L” for latched information or “R” for real time information. All latched flags are “cleared upon read”.

Name Status Register 3/SR3/:ADC
7 6 5 4 3 2 1 0
ADC[7:0]
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset
Address: 0Eh Access: Read only
Bit Name Description
7...0 ADC[7:0] SAR value loaded at the end of the conversion.In Normal mode read only access.In special Test mode,write access possible.In that Test mode,the value of the register is output to the Analog instead of the SAR register value.
Name Test Command- TstCmd / Revision ID- RevID
7 6 5 4 3 2 1 0
Test Command Register / Revision ID
Reset Value:
0 0 0 0 0 0 0 0
Reset Source:nReset/TEST
Address: 0Fh Access: R(W*in Reserved in TEST Mode)
Bit Name Description
7...0 TstCmd[7:0] Special write test command in case of TEST1=high.ONSEMI reserved.
7...0 RevID[7:0] Reads the device revision ID(silicon mask release).RevID=7dec(=[111]bin)forQAA silicon,RevID=6dec(=[110]bin)forPAA silicon.

NCV78663

OTP

Description The OTP (One Time Programmable) Memory contains

The OTP (One Time Programmable) Memory contains 109 bits; 37 bits are for trimming purposes and are programmed at the end of the silicon manufacturing line at ON Semiconductor. The remaining 72 bits are system dependent parameters and are user programmable via the SPI interface and the “ZAP!” operation: these should be considered as the power−up default operating parameters and are typically programmed at the end of the module manufacturing line. The OTP−bits, as the name suggests, can be programmed

The OTP−bits, as the name suggests, can be programmed only once. However, this is not a limiting factor as the system dependent parameters can be updated after power−up via the SPI−interface (the only two exceptions are the boost control rate and the DIAGx response mode, see OTP address map). The OTP Controller operates:

The OTP Controller operates:

  1. either at Startup, to load the default values from

  2. either at Startup, to load the default values from OTP to the SPI registers,

  3. or when the chip is set in Test mode, to get full OTP access depending on the status of the OTPLock−bits.

The OTP memory is controlled via 2 SPI control registers (CR9 and CR10) and the TEST1−pin, which must be high during OTP operations.

OTP Interface The OTP memory is controlled via 2 SPI control registers

SPI−CR9 acts as the OTP Control register OTP_CTRL [7:0]:

Control Register

OTP_CTRL [7] START bit: Set of START bit starts execution of the selected command;

OTP_CTRL [6:5] Command to be executed. The CMD [1:0] list is reported in the table below;

OTP_CMD Bit Code Name Description
CMD_01 “00” Point to OTP cell Copies selected OTP cell value into OTP DATA register. No start bit is needed.
CMD_02 “01” Read OTP cell & refresh Copies selected OTP cell value into OTP DATA register and load all OTP data registers into SPI registers, generating a complete refresh.WARNING: as a consequence, all previously contained values in the SPI registers are overwritten with the OTP content.
CMD_03 “10” Load OTP Shifts OTP_DATA[7:0]in the OTP chain at the corresponding OTP address, ready for zapping.As OTP_CMD_01, this operation generates a full SPI registers refresh.
CMD_04 “11” Zap! OTP The loaded OTP data is zapped in the corresponding OTP register(1bit by 1).As CMD_01 and CMD_10,this operation generates a full SPI registers refresh.Once zapped to“1”,a single bit may not be zapped to“0”anymore.

Programming OTP or “Zap!” Set of OTP_Start bit starts execution of the selected command, written in OTP_CTRL [6:5] bits. At that very moment the OTP address to be accessed, written in OTP_CTRL [3:0] bits, is latched and is kept there until the operation finishes. When OTP state machine completes the command, it clears automatically OTP_Start bit. This allows monitoring the status of the operation by polling of the OTP_Start via SPI.

♦ When accessed for write (through the SPI), that register keeps the data to be used in a “Load OTP” operation ♦ When accessed for read (through the SPI), the data

Programming OTP or “Zap!” Set of OTP_Start bit starts execution of the selected

operation ♦ When accessed for read (through the SPI), the data is taken directly from the OTP registers.

♦ When accessed for read (through the SPI), the data is taken directly from the OTP registers.

default. The only exception is “Point to OTP Cell” command.

30^{\circ}\mathrm{C}

The bit OTPLockInt will be set at the end of the silicon manufacturing line at ON Semiconductor, after device trimming. By doing so, the factory trimming parameters can never be changed by the user as a safety feature.

OTP Lock To prevent unwanted OTP zapping, there is the possibility


NCV78663

User OTP Lock The bit OTPLockExt allows the user to protect the system

will be the system default parameters after power−up. We strongly recommend making use of this lock to avoid unwanted setting changes in the application and to keep TEST1 to GND.

Table 27. OTP ADDRESS MAP

OTP Address Bit N 7 6 5 4 3 2 1 0
0x00 7 Dimming duty factor LED string 1 [7:0]
0x01 15 Dimming duty factor LED string 2 [7:0]
0x02 23 OTPLockInt* Current setting LED string 1 [6:0]
0x03 31 OTPLockExt Current setting LED string 2 [6:0]
0x04 39 LED String 1 diagnostics individual short threshold [7:0]
0x05 47 LED String 2 diagnostics individual short threshold [7:0]
0x06 55 Toff 1 range selection [3:0] Booster output range [3:0]
0x07 63 Booster oscillator frequency [2:0] Booster oscillator accuracy trimming[4:0]*
0x08 71 Bandgap accuracy trimming [2:0]* System oscillator accuracy trimming [4:0]*
0x09 79 Toff 1 accuracy trimming [3:0]* Bandgap accuracy trimming [6:3]*
0x0A 87 DIAGx response mode Boost control rate [2:0] TSD accuracy trimming [3:0]*
0x0B 95 Toff 2 accuracy trimming [3:0]* Toff 2 range selection [3:0]
0x0C 103 BandGap opamp N-trimming [2:0]* BandGap opamp P-trimming[4:0]*
0x0D 111 Not used BOOSTER_DIS PWRDERATE_DIS Dimming freq. factor [2:0]
0x0E 119 Not used
Mapped in both, SPI and OTP address maps (same naming but different address)

Mapped in both, SPI and OTP address maps (same naming but different address)

*Only for ON Semiconductor trimming purpose. Locked if OTPLockInt−bit is set.


NCV78663

DIAGNOSTICS The NCV78663 offers a wide range of device−integrated

The NCV78663 offers a wide range of device−integrated diagnostic features. Their description follows.

Diagnostics Description • Thermal Warning: this mechanism detects a junction

• Thermal Warning: this mechanism detects a junction temperature which is close but lower to the chip maximum allowed, providing the information that some action is required to prevent overheating causing Thermal Shutdown. The thermal warning condition will automatically generate a power derating action by reducing the output duty cycle to 75% of the original value. See Section Automatic Power de−rating. • Booster reached maximum duty cycle: the booster

• Booster reached maximum duty cycle: the booster controller has set the maximum duty cycle to the gate PWM. This means that the booster is not capable to deliver the required energy to the output. Reasons could be either: ♦ input current limit is insufficient;

♦ input current limit is insufficient; input current line to the inductor or MOSFET open;

so that only after both TSD and TW real internal signals disappear, booster and buck converters will be again automatically enabled. This is done to make sure that device can recover also in stand−alone mode (no MCU or SPI Master in the system). The normal operation of booster and buck converters is restored only after the temperature drops below the TW level − thus providing hysteresis for the TSD recovery process. • Power derating warning: Indicates that the power

♦ input current line to the inductor or MOSFET open; ♦ too high load required by the booster and/or too low

• Thermal Shutdown: The junction temperature has reached the TSD level (see Table at 4.9). The booster and the LED outputs are immediately disabled to prevent device overheating. The TSD flag is latched in the SPI SR2 (State 2) register and stays set until the SR2 register is read by the SPI Master. On the other hand, booster and buck converters disable logic is using the real time TSD and TW signals (not the SPI flags),

• Power derating warning: Indicates that the power de−rating function has been activated. See Section Automatic Power De−rating. • SPI Error: SPI frame detected with a length not equal

• SPI Error: SPI frame detected with a length not equal to a multiple of 16 bits. • Boost under voltage error: Detects a boost under

• Boost under voltage error: Detects a boost under voltage by raising the related bit and lowering both DIAGx pins to zero. The Boost voltage error bit in SPI status register is cleared in case of being read or in case of longer than 50 ms low pulse at LEDCTRLx pin. A 50 ms low pulse on the LEDCTRLx releases the relative DIAGx pin as well. • Detection of ‘open’ LED−string: detects if the LED

• Detection of individual shorted LED: the absolute LED−string voltage is monitored and compared to an user−programmable threshold level:

• Detection of ‘open’ LED−string: detects if the LED output voltage has reached the reference minimum booster voltage for the specific range as defined in the table below. The DIAGx pin remains zero as long as low pulse longer than 50 ms is not detected at LEDCTRLx pin. The Open LED−string error bit in SPI status register is cleared in case of being read or in case of longer than 50 ms low pulse at LEDCTRLx pin.

Table 28. OPEN LOAD DIAGNOSTIC DETECTION LEVEL AND BOOST UNDERVOLTAGE DETECTION LEVELS

Open load detection VLED(V) 13 13 13 15 18 20 23 25 28 30 33 35 38 40 45 55
Vboost under voltage(V)
Boost selected RANGE 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

• Detection of ‘shorted’ LED−string: the corresponding error bit is set when the LED voltage is below the threshold level, fixed at 1.9V, with absolute ADC value 06hex typical. The DIAGx pin remains to low value until a low state longer than 50 ms is detected at LEDCTRLx pin. The short error bit in SPI status register is cleared in case of being read or in case of longer than 50 ms low level at LEDCTRLx pin. • Detection of individual shorted LED: the absolute

\sf{I n d S}h o o r h h e s_{X}[V]=80\times\frac{1\ {sf I}S n o r t T h r e s_{S P l_R R a x}(d e c)}{255}.

The default value is fixed in OTP and can be overwritten in a volatile register by a specific SPI command. If the LED−string voltage drops below that absolute level, the chips recognizes single or more shorted LEDs and the error bit is raised in the relative STATUS register (1 or 2). No specific action taken on the DIAGx pins based on this detection.


NCV78663

microcontroller, taking direct advantage of the measured LED voltage via the SPI interface. • Buck regulator over−current error (OCLEDx): this

• Buck regulator over−current error (OCLEDx): this error condition is triggered if the buck current is higher than the OCD level (see Table 15) for 16 consecutive buck periods and the responsible channel is switched off. The conditions for clearing the OCLEDx bits is reading the related SPI STATUSx or keeping LEDCTRLx = 0 for 50 ms.

Diagnostics Feedback Any error which leads to a non−functional LED string is

Any error which leads to a non−functional LED string is reported via the DIAGx (1, 2) pins. Each LED output driver has its own diagnostics output

Each LED output driver has its own diagnostics output DIAGx. Depending on the DIAGx response mode option

(OTP map register 0x0A − bit 7), the behavior of the DIAGx can be either “static” (default, bit = 0) or “pulsed” (bit = 1). In the default case, when the LEDx line is active, the DIAGx is continuously high, providing there is no error detected in the respective LEDx string. Otherwise, if the DIAGx response mode is programmed to “one”, the pulse starts typically at the beginning of LED turn−on and is one−shot high for a duration of 500 ms if no errors are detected. All LED string related errors and boost under voltage

All LED string related errors and boost under voltage error are latched and get cleared when the inputs (LEDCTRLx) are disabled for a time longer than 50 ms. The DIAGx is continuously low if there is any of the

The DIAGx is continuously low if there is any of the responsible errors detected in the respective LED string persists, as summarized in the Diagnostics Summary Table.

Table 29. DIAGNOSTICS SUMMARY TABLE

Diagnose Detection Level Setting DIAGx Feedback LED Output Reset Via: SPI Register
Abbreviation Description LEDTRLx SPI
BoostUV Boost undervoltage Fixed to boost range DIAG1&2 No change Y Y SR1.[6]
TW Thermal Warning See Section On-chip temperature sensor No See Section Automatic Power De-rating N N SR2.[6]
DCmax Booster reached Maximum Dutycycle f(boost range,vBat). No No change N Y SR1.[5]
TSD Thermal Shutdown See Section On-chip temperature sensor DIAG1&2 Disabled.(Re-enabled automatically below TW level) N Y SR2.[5]
PWRderate Power de-rating f(V_bat,TW,PwrDerate_Enb) No See Automatic Power De-rating N Y SR1.[4]
SpiErr SPI frame not multiple of 16 bits N.A. No No change No Y SR2.[4]
OpenLEDx* LED string open circuit V_LEDx>VLED_OpenThres DIAGx* No change Y Y SRx.[3]*
ShortLEDx* LED string short circuit V_LEDx<1.9V DIAGx* No change Y Y SRx.[2]*
IndShortLEDx* Individual LED shorted V_LEDx<individual short threshold No No change Y Y SRx.[1]*
OCLEDx* LED string Over Current I_Buckswitch>OCDSee Section Buck Regulator-Switch DIAGx* Disabled Y Y SRx.[0]*

*...x = ...1 or ...2 \\ See Table 28

\\ See Table 28


NCV78663

PCB LAYOUT RECOMMENDATIONS

This section contains instructions for the NCV78663 PCB The areas which are most critical for a layout point of view layout application design. Although this guide does not are highlighted in the following picture: claim to be exhaustive, these directions can help the developer to reduce application noise impact and insuring the best system operation.

Figure 18. NCV78663: Application Critical Areas at PCB Level

Booster Current Limitation Circuit: AREA (A) C. The MOSFET’s dissipation area should be The booster limitation circuit relies on a low voltage stretched in a direction away from the sense comparator, which triggers with respect to the sense voltage resistor to minimize resistivity changes due to across the external resistor Rboost_sense. In order to heating; maximize power efficiency, the threshold voltage is set to a D. Possibly reduce to the least the distance between rather low value by design (typical 100 mV, see Table 13) Rboost_sense and the NCV78663 boost limitation and this area may be affected by the MOSFET switching comparator’s inputs (IBSTSENSE+ and noise if no specific care is taken. The following IBSTSENSE−); recommendations are given: E. If the current sense measurement tracks are

A. Use a four terminals current sense method as interrupted by series resistors or jumpers (once as depicted in the figure below. The measurement a maximum) their value should be matched and PCB tracks should run in parallel and as close as low ohmic (pair of 0 to 47 max) to avoid possible to each other, trying to have the same errors due to the comparator input bias currents; length. The number of vias along the measurement F. Avoid using the board GND as one of the path should be minimized; measurement terminals as this would also B. Place Rboost_sense sufficiently close to the introduce errors. MOSFET source terminal; ** http://onsemi.com**


NCV78663

Figure 19. Four Wires Sensing Method for Boost Current Limitation Comparator

Buck Current Comparators: AREAs (B1) and (B2) Vboost Related Tracks: AREA (C) The blocks (B1) and (B2) control the buck peak currents The three NCV78663 device pins VBOOST, by means, respectively, of the external sense resistors IBCK1SENSE+ and IBCK2SENSE+ must be at the same Rbuck_1_sense and R_buck_2_sense. As the regulation is individual voltage potential to guarantee proper functioning performed with a comparator, the considerations explained of the internal buck current comparator (whose supply rails in the previous section “Booster Current Limitation Circuit: are Vboost and VboostM3V). In order to achieve this target, AREA (A)” remain valid. it is suggested to make a PCB star track connection between In particular, the use of a four terminals current sense these three points close to the device pins. The width of the method is required, this time applied on (IBCK1xSENSE+, tracks should be large enough (>40 mils) and their length as IBCKxSENSE−). The sensing PCB tracks should be kept as balanced as possible (ideally all equal). short as possible, with the sense resistors close to the device, but preferably outside of its PCB heating area in order to limit measurement errors produced by temperature drifts.

Figure 20. PCB Star Connection Between Vboost, IBCK1SENSE+ and IBCK2SENSE+ (simplified drawing)

** http://onsemi.com**


NCV78663

GND Connection: AREA (D) The NCV78663 GND and GNDP pins must be connected

The NCV78663 GND and GNDP pins must be connected together. It is suggested to perform this connection directly close to the device, behaving also as the cross-junction

between the signal GND (all low power related functions) and the power GND (related to all power switching areas). The device exposed pad should be connected to the GND plane for dissipation purposes.

ORDERING INFORMATION

Device Package Shipping†
NCV78663DQ0G SSOP36 EP(Pb-Free) 47 Units/Rail
NCV78663DQ0R2G SSOP36 EP(Pb-Free) 1000/Tape&Reel

†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.


onsemi

SSOP36 EP CASE 940AB ISSUE A

DIMENSIONS: MILLIMETERS

DATE 19 JAN 2016

NOTES:

  1. DIMENSIONING AND TOLERANCING PER

NOTES:

  1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
  2. CONTROLLING DIMENSION: MILLIMETERS.

ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: MILLIMETERS. 3. DIMENSION b DOES NOT INCLUDE DAMBAR

  1. CONTROLLING DIMENSION: MILLIMETERS.
  2. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.13 TOTAL IN EXCESS OF THE b DIMENSION AT MMC.
  3. DIMENSION b SHALL BE MEASURED BE-

EXCESS OF THE b DIMENSION AT MMC. 4. DIMENSION b SHALL BE MEASURED BE- TWEEN 0.10 AND 0.25 FROM THE TIP. 5. DIMENSIONS D AND E1 DO NOT INCLUDE

TWEEN 0.10 AND 0.25 FROM THE TIP. 5. DIMENSIONS D AND E1 DO NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. DIMENSIONS D AND E1 SHALL BE DETERMINED AT DATUM H. 6. THIS CHAMFER FEATURE IS OPTIONAL. IF

DETERMINED AT DATUM H. 6. THIS CHAMFER FEATURE IS OPTIONAL. IF IT IS NOT PRESENT, A PIN ONE IDENTIFIER MUST BE LOACATED WITHIN THE INDICAT- ED AREA.

DIM MILLIMETERS
MIN MAX
A --- 2.65
A1 --- 0.10
A2 2.15 2.60
b 0.18 0.30
c 0.23 0.32
D 10.30 BSC
D2 5.70 5.90
E 10.30 BSC
E1 7.50 BSC
E2 3.90 4.10
e 0.50 BSC
h 0.25 0.75
L 0.50 0.90
L2 0.25 BSC
M 0° 8°
M1 5° 15°
DOCUMENT NUMBER: 98AON46215E Electronic versions are uncontrolled except when accessed directly from the Document Repository.Printed versions are uncontrolled except when stamped“CONTROLLED COPY”in red.
DESCRIPTION: SSOP36 EXPOSED PAD PAGE 1 OF 1

GENERIC MARKING DIAGRAM*

XXXX = Specific Device Code A = Assembly Location

WL = Wafer Lot YY = Year

YY = Year WW = Work Week

WW = Work Week G = Pb−Free Package

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